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Massively Parallel Parametric Test System

Parent Category: Rocktabs Archive

1801 HFE hotProducts 08

Massively Parallel Parametric Test System

Keysight Technologies announced the third generation of its P9000 series massively parallel parametric test system. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs. For example, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is drastically increasing.

Keysight Technologies
keysight.com

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